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dc.contributor.authorAstudillo Salinas, Darwin Fabián-
dc.contributor.authorMedina Molina, Ruben-
dc.contributor.authorPalacio Baus, Kenneth Samuel-
dc.contributor.authorSolano Quinde, Lizandro Damian-
dc.contributor.authorWong De Balzan, Sara-
dc.date.accessioned2018-01-11T16:47:52Z-
dc.date.available2018-01-11T16:47:52Z-
dc.date.issued2016-08-16-
dc.identifier.isbn9781457702204-
dc.identifier.issn1557170X-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85009064458&doi=10.1109%2fEMBC.2016.7590796&partnerID=40&md5=35f14b3a2bc7631b2c524ca31377d60b-
dc.identifier.urihttp://dspace.ucuenca.edu.ec/handle/123456789/29258-
dc.description.abstractElectrocardiographic stress test records have a lot of artifacts. In this paper we explore a simple method to characterize the amount of artifacts present in unprocessed RR stress test time series. Four time series classes were defined: Very good lead, Good lead, Low quality lead and Useless lead. 65 ECG, 8 lead, records of stress test series were analyzed. Firstly, RR-time series were annotated by two experts. The automatic methodology is based on dividing the RR-time series in non-overlapping windows. Each window is marked as noisy whenever it exceeds an established standard deviation threshold (SDT). Series are classified according to the percentage of windows that exceeds a given value, based upon the first manual annotation. Different SDT were explored. Results show that SDT close to 20% (as a percentage of the mean) provides the best results. The coincidence between annotators classification is 70.77% whereas, the coincidence between the second annotator and the automatic method providing the best matches is larger than 63%. Leads classified as Very good leads and Good leads could be combined to improve automatic heartbeat labeling.-
dc.language.isoen_US-
dc.publisherINSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS INC.-
dc.sourceProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS-
dc.titleCharacterizing artifacts in RR stress test time series-
dc.typeArticle-
dc.description.cityOrlando Florida-
dc.ucuenca.idautor0103907036-
dc.ucuenca.idautor102520123-
dc.ucuenca.idautor0103566360-
dc.ucuenca.idautor0102428893-
dc.ucuenca.idautor081929618-
dc.identifier.doi10.1109/EMBC.2016.7590796-
dc.ucuenca.embargoend2022-01-01 0:00-
dc.ucuenca.afiliacionastudillo-salinas, f., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador-
dc.ucuenca.afiliacionmedina, r., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador-
dc.ucuenca.afiliacionpalacio-baus, k., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador-
dc.ucuenca.afiliacionsolano-quinde, l., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador-
dc.ucuenca.afiliacionwong, s., department of electrical, electronic engineering and telecommunications, university of cuenca, cuenca, ecuador-
dc.ucuenca.volumen2016-October-
dc.ucuenca.indicebibliograficoSCOPUS-
dc.ucuenca.numerocitaciones1-
dc.ucuenca.nombrerevista38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society EMBC 2016-
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